Stability and Leakage Analysis of a Novel PP Based 9T SRAM Cell Using N Curve at Deep Submicron Technology for Multimedia Applications

Shilpi Birla, Rakesh Kumar Singh, Manisha Pattanaik. Stability and Leakage Analysis of a Novel PP Based 9T SRAM Cell Using N Curve at Deep Submicron Technology for Multimedia Applications. Circuits and Systems, 2(4):274-280, 2011. [doi]

@article{BirlaSP11,
  title = {Stability and Leakage Analysis of a Novel PP Based 9T SRAM Cell Using N Curve at Deep Submicron Technology for Multimedia Applications},
  author = {Shilpi Birla and Rakesh Kumar Singh and Manisha Pattanaik},
  year = {2011},
  doi = {10.4236/cs.2011.24038},
  url = {http://dx.doi.org/10.4236/cs.2011.24038},
  researchr = {https://researchr.org/publication/BirlaSP11},
  cites = {0},
  citedby = {0},
  journal = {Circuits and Systems},
  volume = {2},
  number = {4},
  pages = {274-280},
}