William Black, Jun Wang, Xibo Yuan. An Integrated Testbed with Single DC Source for Delivering Symmetrical Square-Wave Excitation Voltage in the Triple Pulse Test. In IECON 2022 - 48th Annual Conference of the IEEE Industrial Electronics Society, Brussels, Belgium, October 17-20, 2022. pages 1-6, IEEE, 2022. [doi]
@inproceedings{BlackWY22, title = {An Integrated Testbed with Single DC Source for Delivering Symmetrical Square-Wave Excitation Voltage in the Triple Pulse Test}, author = {William Black and Jun Wang and Xibo Yuan}, year = {2022}, doi = {10.1109/IECON49645.2022.9968773}, url = {https://doi.org/10.1109/IECON49645.2022.9968773}, researchr = {https://researchr.org/publication/BlackWY22}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {IECON 2022 - 48th Annual Conference of the IEEE Industrial Electronics Society, Brussels, Belgium, October 17-20, 2022}, publisher = {IEEE}, isbn = {978-1-6654-8025-3}, }