Independent component decomposition of around ear EEG data to detect artifacts

Martin G. Bleichner, Stefan Debener. Independent component decomposition of around ear EEG data to detect artifacts. In 2019 IEEE International Conference on Systems, Man and Cybernetics, SMC 2019, Bari, Italy, October 6-9, 2019. pages 3631-3634, IEEE, 2019. [doi]

Authors

Martin G. Bleichner

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Stefan Debener

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