Gary D. Boetticher. Nearest neighbor sampling for better defect prediction. ACM SIGSOFT Software Engineering Notes, 30(4):1-6, 2005. [doi]
@article{Boetticher05, title = {Nearest neighbor sampling for better defect prediction}, author = {Gary D. Boetticher}, year = {2005}, doi = {10.1145/1082983.1083173}, url = {http://doi.acm.org/10.1145/1082983.1083173}, researchr = {https://researchr.org/publication/Boetticher05}, cites = {0}, citedby = {0}, journal = {ACM SIGSOFT Software Engineering Notes}, volume = {30}, number = {4}, pages = {1-6}, }