Eran Borenstein, Eitan Sharon, Shimon Ullman. Combining Top-Down and Bottom-Up Segmentation. In IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2004, Washington, DC, USA, June 27 - July 2, 2004. pages 46, IEEE, 2004. [doi]
@inproceedings{BorensteinSU04,
title = {Combining Top-Down and Bottom-Up Segmentation},
author = {Eran Borenstein and Eitan Sharon and Shimon Ullman},
year = {2004},
url = {http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1384838},
researchr = {https://researchr.org/publication/BorensteinSU04},
cites = {0},
citedby = {0},
pages = {46},
booktitle = {IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2004, Washington, DC, USA, June 27 - July 2, 2004},
publisher = {IEEE},
}