Technical Artifact: An Integrated Perspective

Stefano Borgo, Maarten Franssen, Pawel Garbacz, Yoshinobu Kitamura, Riichiro Mizoguchi, Pieter E. Vermaas. Technical Artifact: An Integrated Perspective. In Pieter E. Vermaas, Virginia Dignum, editors, Formal Ontologies Meet Industry, Proceedings of the Fifth International Workshop, FOMI 2011, July 7-8, 2011, Delft, Netherlands. Proceedings. Volume 229 of Frontiers in Artificial Intelligence and Applications, pages 3-15, IOS Press, 2011. [doi]

@inproceedings{BorgoFGKMV11,
  title = {Technical Artifact: An Integrated Perspective},
  author = {Stefano Borgo and Maarten Franssen and Pawel Garbacz and Yoshinobu Kitamura and Riichiro Mizoguchi and Pieter E. Vermaas},
  year = {2011},
  doi = {10.3233/978-1-60750-785-7-3},
  url = {http://dx.doi.org/10.3233/978-1-60750-785-7-3},
  researchr = {https://researchr.org/publication/BorgoFGKMV11},
  cites = {0},
  citedby = {0},
  pages = {3-15},
  booktitle = {Formal Ontologies Meet Industry, Proceedings of the Fifth International Workshop, FOMI 2011, July 7-8, 2011, Delft, Netherlands. Proceedings},
  editor = {Pieter E. Vermaas and Virginia Dignum},
  volume = {229},
  series = {Frontiers in Artificial Intelligence and Applications},
  publisher = {IOS Press},
  isbn = {978-1-60750-785-7},
}