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Analysis of back-to-back MMC for medium voltage applications under faulted condition

Anurag Bose, Joao Martins, Sanjay K. Chaudhary, Remus Teodorescu. Analysis of back-to-back MMC for medium voltage applications under faulted condition. In IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29 - November 1, 2017. pages 858-963, IEEE, 2017. [doi]

Authors

Anurag Bose

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Joao Martins

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Sanjay K. Chaudhary

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Remus Teodorescu

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