Alberto Bosio, Mario Barbareschi. Special Issue on Design, Technology, and Test of Integrated Circuits and Systems. Journal of Circuits, Systems, and Computers, 28(Supplement-1), 2019. [doi]
@article{BosioB19,
title = {Special Issue on Design, Technology, and Test of Integrated Circuits and Systems},
author = {Alberto Bosio and Mario Barbareschi},
year = {2019},
doi = {10.1142/S0218126619020018},
url = {https://doi.org/10.1142/S0218126619020018},
researchr = {https://researchr.org/publication/BosioB19},
cites = {0},
citedby = {0},
journal = {Journal of Circuits, Systems, and Computers},
volume = {28},
number = {Supplement-1},
}