Smart Temperature Sensor for Thermal Testing of Cell-Based ICs

Sebastià A. Bota, M. Rosales, José Luis Rosselló, Jaume Segura. Smart Temperature Sensor for Thermal Testing of Cell-Based ICs. In 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany. pages 464-465, IEEE Computer Society, 2005. [doi]

@inproceedings{BotaRRS05,
  title = {Smart Temperature Sensor for Thermal Testing of Cell-Based ICs},
  author = {Sebastià A. Bota and M. Rosales and José Luis Rosselló and Jaume Segura},
  year = {2005},
  doi = {10.1109/DATE.2005.271},
  url = {http://doi.ieeecomputersociety.org/10.1109/DATE.2005.271},
  tags = {rule-based, testing},
  researchr = {https://researchr.org/publication/BotaRRS05},
  cites = {0},
  citedby = {0},
  pages = {464-465},
  booktitle = {2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March  2005, Munich, Germany},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-2288-2},
}