Accurate alpha soft error rate evaluation in SRAM memories

Sebastiàn A. Bota, Gabriel Torrens, I. de Paul, Bartomeu Alorda, L. A. Segura. Accurate alpha soft error rate evaluation in SRAM memories. In 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013. pages 205-209, IEEE, 2013. [doi]

Authors

Sebastiàn A. Bota

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Gabriel Torrens

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I. de Paul

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Bartomeu Alorda

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L. A. Segura

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