A new formalism that combines advantages of fault-trees and Markov models: Boolean logic driven Markov processes

Marc Bouissou, Jean-Louis Bon. A new formalism that combines advantages of fault-trees and Markov models: Boolean logic driven Markov processes. Rel. Eng. & Sys. Safety, 82(2):149-163, 2003. [doi]

Authors

Marc Bouissou

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Jean-Louis Bon

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