Biometric identification of identical twins: A survey

Kevin W. Bowyer, Patrick J. Flynn. Biometric identification of identical twins: A survey. In 8th IEEE International Conference on Biometrics Theory, Applications and Systems, BTAS 2016, Niagara Falls, NY, USA, September 6-9, 2016. pages 1-8, IEEE, 2016. [doi]

Authors

Kevin W. Bowyer

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Patrick J. Flynn

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