Learning Metrics Between Tree Structured Data: Application to Image Recognition

Laurent Boyer 0002, Amaury Habrard, Marc Sebban. Learning Metrics Between Tree Structured Data: Application to Image Recognition. In Joost N. Kok, Jacek Koronacki, Ramon López de Mántaras, Stan Matwin, Dunja Mladenic, Andrzej Skowron, editors, Machine Learning: ECML 2007, 18th European Conference on Machine Learning, Warsaw, Poland, September 17-21, 2007, Proceedings. Volume 4701 of Lecture Notes in Computer Science, pages 54-66, Springer, 2007. [doi]

Authors

Laurent Boyer 0002

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Amaury Habrard

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Marc Sebban

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