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Board-Level BIST

J. Braden, K. Brough, J. Evans, Martin P. McHugh, G. Young. Board-Level BIST. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 504-505, IEEE Computer Society, 1996. [doi]

Authors

J. Braden

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K. Brough

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J. Evans

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Martin P. McHugh

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G. Young

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