Gate delay fault test generation for non-scan circuits - researchr publication authors

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G. Van Brakel, Uwe Gläser, Hans G. Kerkhoff, Heinrich Theodor Vierhaus. Gate delay fault test generation for non-scan circuits. In 1995 European Design and Test Conference, ED&TC 1995, Paris, France, March 6-9, 1995. pages 308-313, IEEE Computer Society, 1995. [doi]

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