J. van den Brand, J. de Baets, T. van Mol, A. Dietzel. Systems-in-foil - Devices, fabrication processes and reliability issues. Microelectronics Reliability, 48(8-9):1123-1128, 2008. [doi]
@article{BrandBMD08, title = {Systems-in-foil - Devices, fabrication processes and reliability issues}, author = {J. van den Brand and J. de Baets and T. van Mol and A. Dietzel}, year = {2008}, doi = {10.1016/j.microrel.2008.06.030}, url = {http://dx.doi.org/10.1016/j.microrel.2008.06.030}, researchr = {https://researchr.org/publication/BrandBMD08}, cites = {0}, citedby = {0}, journal = {Microelectronics Reliability}, volume = {48}, number = {8-9}, pages = {1123-1128}, }