Maturity Evaluation of SDKs for I4.0 Digital Twins

Nico Braunisch, Robert Lehmann 0001, Martin Wollschlaeger, Marko Ristin, Hans Wernher van de Venn, Björn Otto, Tobias Kleinert. Maturity Evaluation of SDKs for I4.0 Digital Twins. In 28th IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2023, Sinaia, Romania, September 12-15, 2023. pages 1-8, IEEE, 2023. [doi]

Authors

Nico Braunisch

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Robert Lehmann 0001

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Martin Wollschlaeger

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Marko Ristin

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Hans Wernher van de Venn

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Björn Otto

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Tobias Kleinert

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