James D. Bray. ATE Test Head Requirements for Low-Cost VLSI Testing. In Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986. pages 568-591, IEEE Computer Society, 1986.
@inproceedings{Bray86:0,
title = {ATE Test Head Requirements for Low-Cost VLSI Testing},
author = {James D. Bray},
year = {1986},
tags = {testing},
researchr = {https://researchr.org/publication/Bray86%3A0},
cites = {0},
citedby = {0},
pages = {568-591},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C., USA, September 1986},
publisher = {IEEE Computer Society},
}