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RUGRAT: Runtime Test Case Generation Using Dynamic Compilers

Ben Breech, Lori L. Pollock, John Cavazos. RUGRAT: Runtime Test Case Generation Using Dynamic Compilers. In 19th International Symposium on Software Reliability Engineering (ISSRE 2008), 11-14 November 2008, Seattle/Redmond, WA, USA. pages 137-146, IEEE Computer Society, 2008. [doi]

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Ben Breech

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Lori L. Pollock

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John Cavazos

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