Holistic system modeling of capacitive sensors: From sensor circuitry to calibration

Thomas Bretterklieber, Markus Neumayer, Matthias Flatscher. Holistic system modeling of capacitive sensors: From sensor circuitry to calibration. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018, Houston, TX, USA, May 14-17, 2018. pages 1-6, IEEE, 2018. [doi]

Authors

Thomas Bretterklieber

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Markus Neumayer

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Matthias Flatscher

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