Using simulation for assessing the real impact of test coverage on defect coverage

Lionel C. Briand, Dietmar Pfahl. Using simulation for assessing the real impact of test coverage on defect coverage. In 10th International Symposium on Software Reliability Engineering, ISSRE, 1999, Boca Raton, FL, USA, November 1-4, 1999. pages 148-157, IEEE Computer Society, 1999. [doi]

@inproceedings{BriandP99,
  title = {Using simulation for assessing the real impact of test coverage on defect coverage},
  author = {Lionel C. Briand and Dietmar Pfahl},
  year = {1999},
  doi = {10.1109/ISSRE.1999.809319},
  url = {http://doi.ieeecomputersociety.org/10.1109/ISSRE.1999.809319},
  researchr = {https://researchr.org/publication/BriandP99},
  cites = {0},
  citedby = {0},
  pages = {148-157},
  booktitle = {10th International Symposium on Software Reliability Engineering, ISSRE, 1999, Boca Raton, FL, USA, November 1-4, 1999},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-0443-4},
}