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    Quality Assessment for Embedded SQL

    Huib van den Brink, Rob van der Leek, Joost Visser. Quality Assessment for Embedded SQL. In Seventh IEEE International Workshop on Source Code Analysis and Manipulation (SCAM 2007), September 30 - October 1, 2007, Paris, France. pages 163-170, IEEE, 2007. [doi]

    Authors

    Huib van den Brink

    Identified as Huib van den Brink
    (Universiteit Utrecht
    )

    Rob van der Leek

    Identified as Rob van der Leek
    (Software Improvement Group, Amsterdam, Netherlands
    )

    Joost Visser

    Identified as Joost Visser
    (Software Improvement Group (SIG)
    )
    runs on