Jason G. Brown, R. D. (Shawn) Blanton. Automated Standard Cell Library Analysis for Improved Defect Modeling. In 9th International Symposium on Quality of Electronic Design (ISQED 2008), 17-19 March 2008, San Jose, CA, USA. pages 643-648, IEEE Computer Society, 2008. [doi]
@inproceedings{BrownB08:0,
title = {Automated Standard Cell Library Analysis for Improved Defect Modeling},
author = {Jason G. Brown and R. D. (Shawn) Blanton},
year = {2008},
doi = {10.1109/ISQED.2008.169},
url = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2008.169},
tags = {modeling, analysis},
researchr = {https://researchr.org/publication/BrownB08%3A0},
cites = {0},
citedby = {0},
pages = {643-648},
booktitle = {9th International Symposium on Quality of Electronic Design (ISQED 2008), 17-19 March 2008, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3117-5},
}