Floriane Brunetto, Julien Peuch, Samuel Bassetto. System risk analysis enhanced with system graph properties. In Annual IEEE Systems Conference, SysCon 2015, Proceedings, Vancouver, BC, Canada, April 13-16, 2015. pages 289-294, IEEE, 2015. [doi]
@inproceedings{BrunettoPB15,
title = {System risk analysis enhanced with system graph properties},
author = {Floriane Brunetto and Julien Peuch and Samuel Bassetto},
year = {2015},
doi = {10.1109/SYSCON.2015.7116766},
url = {http://dx.doi.org/10.1109/SYSCON.2015.7116766},
researchr = {https://researchr.org/publication/BrunettoPB15},
cites = {0},
citedby = {0},
pages = {289-294},
booktitle = {Annual IEEE Systems Conference, SysCon 2015, Proceedings, Vancouver, BC, Canada, April 13-16, 2015},
publisher = {IEEE},
isbn = {978-1-4799-5927-3},
}