Lucas Brusamarello, Gilson I. Wirth, Roberto da Silva. Statistical RTS model for digital circuits. Microelectronics Reliability, 49(9-11):1064-1069, 2009. [doi]
@article{BrusamarelloWS09,
title = {Statistical RTS model for digital circuits},
author = {Lucas Brusamarello and Gilson I. Wirth and Roberto da Silva},
year = {2009},
doi = {10.1016/j.microrel.2009.06.025},
url = {http://dx.doi.org/10.1016/j.microrel.2009.06.025},
tags = {meta-model, Meta-Environment},
researchr = {https://researchr.org/publication/BrusamarelloWS09},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {49},
number = {9-11},
pages = {1064-1069},
}