Ilya Budovsky, Abdul Rashid Bin Zainal Abidin, Aaron Y. K. Yan, LingXiang Liu, Vijay Kumar Rustagi, Anil Kumar Govil, Manfred Klonz, Yih-cheng Wei, Murray D. Early, Hitoshi Sasaki, Hiroyuki Fujiki, Chalit Kumtawee, Ajchara Charoensook, Sung-Won Kwon, Nguyen Ahn Son, Bambang Suprianto, Moses Temba, Manuel Ruiz, Sabino Paulo B. Leones Jr.. APMP international comparison of AC-DC transfer standards at the lowest attainable level of uncertainty. IEEE T. Instrumentation and Measurement, 54(2):795-798, 2005. [doi]
@article{BudovskyAYLRGKWESFKCKSSTRL05,
title = {APMP international comparison of AC-DC transfer standards at the lowest attainable level of uncertainty},
author = {Ilya Budovsky and Abdul Rashid Bin Zainal Abidin and Aaron Y. K. Yan and LingXiang Liu and Vijay Kumar Rustagi and Anil Kumar Govil and Manfred Klonz and Yih-cheng Wei and Murray D. Early and Hitoshi Sasaki and Hiroyuki Fujiki and Chalit Kumtawee and Ajchara Charoensook and Sung-Won Kwon and Nguyen Ahn Son and Bambang Suprianto and Moses Temba and Manuel Ruiz and Sabino Paulo B. Leones Jr.},
year = {2005},
doi = {10.1109/TIM.2004.843088},
url = {http://dx.doi.org/10.1109/TIM.2004.843088},
researchr = {https://researchr.org/publication/BudovskyAYLRGKWESFKCKSSTRL05},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {54},
number = {2},
pages = {795-798},
}