Analysis of an Artifact Oriented Test Process Model and of Testing Aspects of ISO/IEC 15504 - researchr publication authors

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Paulo Marcos Siqueira Bueno, Adalberto Nobiato Crespo, Clenio F. Salviano, Mario Jino. Analysis of an Artifact Oriented Test Process Model and of Testing Aspects of ISO/IEC 15504. In Mónica Villavicencio, Carlos Monsalve, María Verónica Macías Mendoza, Guillermo Pizarro, Lohana Lema, Stephanie Flores, editors, VII Jornadas Iberoamericanas de Ingeniería de Software e Ingeniería del Conocimiento 2008, Guayaquil, Ecuador, January 30 - February 1, 2008. Proceedings. pages 147-154, Área de Ingeniería de Software VLIR-ESPOL Componente 8, Facultad de Ingeniería Eléctrica y Computación, Escuela Superior Politécnica del Litoral, 2008.

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