Origin of the Half-Wavelength Errors in Microwave Measurements Using Through-Line Calibrations

P. Mark Buff, Jayesh Nath, Michael B. Steer. Origin of the Half-Wavelength Errors in Microwave Measurements Using Through-Line Calibrations. IEEE T. Instrumentation and Measurement, 56(5):1610-1615, 2007. [doi]

Authors

P. Mark Buff

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Jayesh Nath

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Michael B. Steer

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