Comparison of Single-Particle Monte Carlo Simulation with Measured Output Characteristics of an 0.1µm n-MOSFET - researchr publication authors

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F. M. Bufler, Andreas Schenk, Christoph Zechner, Natsuko Inada, Yoshinori Asahi, Wolfgang Fichtner. Comparison of Single-Particle Monte Carlo Simulation with Measured Output Characteristics of an 0.1µm n-MOSFET. VLSI Design, 2002(4):715-720, 2002. [doi]

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