Sophie Burkhardt, Stefan Kramer 0001. Multi-label Classification Using Stacked Hierarchical Dirichlet Processes with Reduced Sampling Complexity. In IEEE International Conference on Big Knowledge, ICBK 2017, Hefei, China, August 9-10, 2017. pages 1-8, IEEE, 2017. [doi]
@inproceedings{Burkhardt017,
title = {Multi-label Classification Using Stacked Hierarchical Dirichlet Processes with Reduced Sampling Complexity},
author = {Sophie Burkhardt and Stefan Kramer 0001},
year = {2017},
doi = {10.1109/ICBK.2017.27},
url = {http://doi.ieeecomputersociety.org/10.1109/ICBK.2017.27},
researchr = {https://researchr.org/publication/Burkhardt017},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {IEEE International Conference on Big Knowledge, ICBK 2017, Hefei, China, August 9-10, 2017},
publisher = {IEEE},
isbn = {978-1-5386-3120-1},
}