Microwave Thermal Emission Characteristics of a Two-Layer Medium With Rough Interfaces Using the Second-Order Small Perturbation Method

Robert J. Burkholder, Joel T. Johnson, Mohammadreza Sanamzadeh, L. Tsang, Shurun Tan. Microwave Thermal Emission Characteristics of a Two-Layer Medium With Rough Interfaces Using the Second-Order Small Perturbation Method. IEEE Geosci. Remote Sensing Lett., 14(10):1780-1784, 2017. [doi]

@article{BurkholderJSTT17,
  title = {Microwave Thermal Emission Characteristics of a Two-Layer Medium With Rough Interfaces Using the Second-Order Small Perturbation Method},
  author = {Robert J. Burkholder and Joel T. Johnson and Mohammadreza Sanamzadeh and L. Tsang and Shurun Tan},
  year = {2017},
  doi = {10.1109/LGRS.2017.2735421},
  url = {https://doi.org/10.1109/LGRS.2017.2735421},
  researchr = {https://researchr.org/publication/BurkholderJSTT17},
  cites = {0},
  citedby = {0},
  journal = {IEEE Geosci. Remote Sensing Lett.},
  volume = {14},
  number = {10},
  pages = {1780-1784},
}