Christian Burmer, Siegfried Görlich. Failure analyses for debug and ramp-up of modern IC s. Microelectronics Reliability, 46(9-11):1486-1497, 2006. [doi]
@article{BurmerG06,
title = {Failure analyses for debug and ramp-up of modern IC s},
author = {Christian Burmer and Siegfried Görlich},
year = {2006},
doi = {10.1016/j.microrel.2006.07.024},
url = {http://dx.doi.org/10.1016/j.microrel.2006.07.024},
tags = {debugging},
researchr = {https://researchr.org/publication/BurmerG06},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {46},
number = {9-11},
pages = {1486-1497},
}