Stuart Byma, James R. Larus. Detailed heap profiling. In Hannes Payer, Jennifer B. Sartor, editors, Proceedings of the 2018 ACM SIGPLAN International Symposium on Memory Management, ISMM 2018, Philadelphia, PA, USA, June 18, 2018. pages 1-13, ACM, 2018. [doi]
@inproceedings{BymaL18,
title = {Detailed heap profiling},
author = {Stuart Byma and James R. Larus},
year = {2018},
doi = {10.1145/3210563.3210564},
url = {http://doi.acm.org/10.1145/3210563.3210564},
researchr = {https://researchr.org/publication/BymaL18},
cites = {0},
citedby = {0},
pages = {1-13},
booktitle = {Proceedings of the 2018 ACM SIGPLAN International Symposium on Memory Management, ISMM 2018, Philadelphia, PA, USA, June 18, 2018},
editor = {Hannes Payer and Jennifer B. Sartor},
publisher = {ACM},
}