Jesus Caban, Penny Rheingans. Relational statistical deformation models for morphological image analysis and classification. In Proceedings of the 2010 IEEE International Symposium on Biomedical Imaging: From Nano to Macro, Rotterdam, The Netherlands, 14-17 April, 2010. pages 1333-1336, IEEE, 2010. [doi]
@inproceedings{CabanR10,
title = {Relational statistical deformation models for morphological image analysis and classification},
author = {Jesus Caban and Penny Rheingans},
year = {2010},
doi = {10.1109/ISBI.2010.5490243},
url = {http://dx.doi.org/10.1109/ISBI.2010.5490243},
tags = {classification, analysis},
researchr = {https://researchr.org/publication/CabanR10},
cites = {0},
citedby = {0},
pages = {1333-1336},
booktitle = {Proceedings of the 2010 IEEE International Symposium on Biomedical Imaging: From Nano to Macro, Rotterdam, The Netherlands, 14-17 April, 2010},
publisher = {IEEE},
isbn = {978-1-4244-4125-9},
}