A. Caddemi, N. Donato. Temperature-dependent noise characterization and modeling of on-wafer microwave transistors. Microelectronics Reliability, 42(3):361-366, 2002. [doi]
@article{CaddemiD02,
title = {Temperature-dependent noise characterization and modeling of on-wafer microwave transistors},
author = {A. Caddemi and N. Donato},
year = {2002},
doi = {10.1016/S0026-2714(02)00004-5},
url = {http://dx.doi.org/10.1016/S0026-2714(02)00004-5},
tags = {modeling},
researchr = {https://researchr.org/publication/CaddemiD02},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {42},
number = {3},
pages = {361-366},
}