Linlin Cai, Wangyong Chen, JinFeng Kang, Gang Du, Xiaoyan Liu, Xing Zhang. A physics-based electromigration reliability model for interconnects lifetime prediction. Science in China Series F: Information Sciences, 64(11), 2021. [doi]
@article{CaiCKDLZ21,
title = {A physics-based electromigration reliability model for interconnects lifetime prediction},
author = {Linlin Cai and Wangyong Chen and JinFeng Kang and Gang Du and Xiaoyan Liu and Xing Zhang},
year = {2021},
doi = {10.1007/s11432-020-3140-4},
url = {https://doi.org/10.1007/s11432-020-3140-4},
researchr = {https://researchr.org/publication/CaiCKDLZ21},
cites = {0},
citedby = {0},
journal = {Science in China Series F: Information Sciences},
volume = {64},
number = {11},
}