Efficient reliability evaluation methodologies for combinational circuits - researchr publication authors

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Hao Cai, Kaikai Liu, Lirida Alves de Barros Naviner, You Wang, Mariem Slimani, Jean-François Naviner. Efficient reliability evaluation methodologies for combinational circuits. Microelectronics Reliability, 64:19-25, 2016. [doi]

This author has not been identified. Look up 'Hao Cai' in GoogleThis author has not been identified. Look up 'Kaikai Liu' in GoogleThis author has not been identified. Look up 'Lirida Alves de Barros Naviner' in GoogleThis author has not been identified. Look up 'You Wang' in GoogleThis author has not been identified. Look up 'Mariem Slimani' in GoogleThis author has not been identified. Look up 'Jean-François Naviner' in Google

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