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Measuring Nanoscale Distances by Structured Illumination Microscopy and Image Cross-Correlation Spectroscopy (SIM-ICCS)

Isotta Cainero, Elena Cerutti, Mario Faretta, Gaetano Dellino, Pier Giuseppe Pelicci, Alberto Diaspro, Luca Lanzanò. Measuring Nanoscale Distances by Structured Illumination Microscopy and Image Cross-Correlation Spectroscopy (SIM-ICCS). Sensors, 21(6):2010, 2021. [doi]

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