Selecting feature lines in generalized dissimilarity representations for pattern recognition

Yenisel Plasencia Calana, Mauricio Orozco-Alzate, Edel B. García Reyes, Robert P. W. Duin. Selecting feature lines in generalized dissimilarity representations for pattern recognition. Digital Signal Processing, 23(3):902-911, 2013. [doi]

Authors

Yenisel Plasencia Calana

This author has not been identified. Look up 'Yenisel Plasencia Calana' in Google

Mauricio Orozco-Alzate

This author has not been identified. Look up 'Mauricio Orozco-Alzate' in Google

Edel B. García Reyes

This author has not been identified. Look up 'Edel B. García Reyes' in Google

Robert P. W. Duin

This author has not been identified. Look up 'Robert P. W. Duin' in Google