Antonio Campello, Vinay A. Vaishampayan. Reliability of erasure coded storage systems: A geometric approach. In Xiaohua Hu, Tsau Young Lin, Vijay Raghavan, Benjamin W. Wah, Ricardo A. Baeza-Yates, Geoffrey Fox, Cyrus Shahabi, Matthew Smith, Qiang Yang 0001, Rayid Ghani, Wei Fan, Ronny Lempel, Raghunath Nambiar, editors, Proceedings of the 2013 IEEE International Conference on Big Data, 6-9 October 2013, Santa Clara, CA, USA. pages 12-16, IEEE, 2013. [doi]
@inproceedings{CampelloV13,
title = {Reliability of erasure coded storage systems: A geometric approach},
author = {Antonio Campello and Vinay A. Vaishampayan},
year = {2013},
doi = {10.1109/BigData.2013.6691662},
url = {http://dx.doi.org/10.1109/BigData.2013.6691662},
researchr = {https://researchr.org/publication/CampelloV13},
cites = {0},
citedby = {0},
pages = {12-16},
booktitle = {Proceedings of the 2013 IEEE International Conference on Big Data, 6-9 October 2013, Santa Clara, CA, USA},
editor = {Xiaohua Hu and Tsau Young Lin and Vijay Raghavan and Benjamin W. Wah and Ricardo A. Baeza-Yates and Geoffrey Fox and Cyrus Shahabi and Matthew Smith and Qiang Yang 0001 and Rayid Ghani and Wei Fan and Ronny Lempel and Raghunath Nambiar},
publisher = {IEEE},
isbn = {978-1-4799-1292-6},
}