Wei Cao, Zhanchuan Cai, Ben Ye. Measuring Multiresolution Surface Roughness Using V-System. IEEE T. Geoscience and Remote Sensing, 56(3):1497-1506, 2018. [doi]
@article{CaoCY18,
title = {Measuring Multiresolution Surface Roughness Using V-System},
author = {Wei Cao and Zhanchuan Cai and Ben Ye},
year = {2018},
doi = {10.1109/TGRS.2017.2764519},
url = {https://doi.org/10.1109/TGRS.2017.2764519},
researchr = {https://researchr.org/publication/CaoCY18},
cites = {0},
citedby = {0},
journal = {IEEE T. Geoscience and Remote Sensing},
volume = {56},
number = {3},
pages = {1497-1506},
}