CMOS Circuits for On-Chip Capacitance Ratio Testing or Sensor Readout

Yuming Cao, Gabor C. Temes. CMOS Circuits for On-Chip Capacitance Ratio Testing or Sensor Readout. In ISCAS. pages 1848-1851, 1995.

@inproceedings{CaoT95,
  title = {CMOS Circuits for On-Chip Capacitance Ratio Testing or Sensor Readout},
  author = {Yuming Cao and Gabor C. Temes},
  year = {1995},
  tags = {testing, C++},
  researchr = {https://researchr.org/publication/CaoT95},
  cites = {0},
  citedby = {0},
  pages = {1848-1851},
  booktitle = {ISCAS},
}