F. Carastro, Alberto Castellazzi, J. C. Clare, M. Johnson, M. Bland, P. W. Wheeler. Reliability considerations in pulsed power resonant conversion. Microelectronics Reliability, 49(9-11):1352-1357, 2009. [doi]
@article{CarastroCCJBW09,
title = {Reliability considerations in pulsed power resonant conversion},
author = {F. Carastro and Alberto Castellazzi and J. C. Clare and M. Johnson and M. Bland and P. W. Wheeler},
year = {2009},
doi = {10.1016/j.microrel.2009.06.039},
url = {http://dx.doi.org/10.1016/j.microrel.2009.06.039},
tags = {C++, reliability},
researchr = {https://researchr.org/publication/CarastroCCJBW09},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {49},
number = {9-11},
pages = {1352-1357},
}