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Test System for an SRAM-Based Mixed-Signal Accelerator

Michele Caselli, Francesco Malena, Andrea Boni. Test System for an SRAM-Based Mixed-Signal Accelerator. In Massimo Ruo Roch, Andrés Gómez, Luca Lazzaroni, Maurizio Martina, Paolo Motto Ros, Nuria Pazos Escudero, Riccardo Berta, editors, Applications in Electronics Pervading Industry, Environment and Society - APPLEPIES 2025, Turin, Italy, September 11-12, 2025. Volume 1553 of Lecture Notes in Electrical Engineering, pages 169-175, Springer, 2025. [doi]

Authors

Michele Caselli

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Francesco Malena

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Andrea Boni

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