Luca Cassano. Analysis and test of the effects of single event upsets affecting the configuration memory of SRAM-based FPGAs. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-10, IEEE, 2014. [doi]
@inproceedings{Cassano14,
title = {Analysis and test of the effects of single event upsets affecting the configuration memory of SRAM-based FPGAs},
author = {Luca Cassano},
year = {2014},
doi = {10.1109/TEST.2014.7035366},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035366},
researchr = {https://researchr.org/publication/Cassano14},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014},
publisher = {IEEE},
isbn = {978-1-4799-4722-5},
}