Windowpane Detection Based on Maximum Aposteriori Probability Labeling - researchr publication authors

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Jan Cech, Radim Sára. Windowpane Detection Based on Maximum Aposteriori Probability Labeling. In Reneta P. Barneva, Valentin E. Brimkov, editors, Image Analysis - From Theory to Applications. Proceedings of IWCIA 2008 Special Track on Applications, Buffalo, NY, USA, April 7-9, 2008. pages 3-11, Research Publishing, 2008.

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