Conductive filaments multiplicity as a variability factor in CBRAM - researchr publication authors

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Umberto Celano, Ludovic Goux, Attilio Belmonte, Karl Opsomer, Christophe Detavernier, Malgorzata Jurczak, Wilfried Vandervorst. Conductive filaments multiplicity as a variability factor in CBRAM. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 11, IEEE, 2015. [doi]

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