John W. Center. Quantitative measures of MIS quality assurance during hardware conversion. In American Federation of Information Processing Societies: 1981 National Computer Conference, 4-7 May 1981, Chicago, Illinois, USA. Volume 50 of AFIPS Conference Proceedings, pages 323-327, AFIPS Press, 1981. [doi]
@inproceedings{Center81,
title = {Quantitative measures of MIS quality assurance during hardware conversion},
author = {John W. Center},
year = {1981},
doi = {10.1145/1500412.1500457},
url = {http://doi.acm.org/10.1145/1500412.1500457},
researchr = {https://researchr.org/publication/Center81},
cites = {0},
citedby = {0},
pages = {323-327},
booktitle = {American Federation of Information Processing Societies: 1981 National Computer Conference, 4-7 May 1981, Chicago, Illinois, USA},
volume = {50},
series = {AFIPS Conference Proceedings},
publisher = {AFIPS Press},
}