G. Ceschini, M. Mugnaini, A. Masi. A reliability study for a submarine compression application. Microelectronics Reliability, 42(9-11):1377-1380, 2002. [doi]
@article{CeschiniMM02,
title = {A reliability study for a submarine compression application},
author = {G. Ceschini and M. Mugnaini and A. Masi},
year = {2002},
doi = {10.1016/S0026-2714(02)00153-1},
url = {http://dx.doi.org/10.1016/S0026-2714(02)00153-1},
tags = {reliability},
researchr = {https://researchr.org/publication/CeschiniMM02},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {42},
number = {9-11},
pages = {1377-1380},
}