Hakan Cevikalp, Hasan Serhan Yavuz. Large Margin Classifier Based on Affine Hulls. In 20th International Conference on Pattern Recognition, ICPR 2010, Istanbul, Turkey, 23-26 August 2010. pages 21-24, IEEE, 2010. [doi]
@inproceedings{CevikalpY10,
title = {Large Margin Classifier Based on Affine Hulls},
author = {Hakan Cevikalp and Hasan Serhan Yavuz},
year = {2010},
doi = {10.1109/ICPR.2010.14},
url = {http://dx.doi.org/10.1109/ICPR.2010.14},
tags = {rule-based},
researchr = {https://researchr.org/publication/CevikalpY10},
cites = {0},
citedby = {0},
pages = {21-24},
booktitle = {20th International Conference on Pattern Recognition, ICPR 2010, Istanbul, Turkey, 23-26 August 2010},
publisher = {IEEE},
}